1064nm Silicon Scanning Mirrors

Silicon Scanning Mirrors 1064nm

Silicon mirrors have the advantages of light weight, small size, good thermal stability, and high mechanical strength. Applied to lasers, telescopes, microscopes, scanners, etc. Galvanometer scanning is the process of first incident the laser beam generated by the laser emission device onto the X-axis galvanometer, then reflecting it onto the Y-axis galvanometer. After secondary reflection by the Y-axis galvanometer, it can be projected onto the working plane, forming a scanning point. Then, the beam deflector composed of X and Y scanning heads is driven by a galvanometer motor to deflect the laser beam within the predetermined scanning range, so that the laser focal point with a certain power density leaves a permanent mark on the marking material, completing the scanning of the image. Each beam deflector has a specially designed reflective lens, and the different deflection methods of the two lenses can enable the laser to scan different shapes and print different models. Can be coated with reflective film, anti reflective film, filter film, spectroscopic film, polarizing film, and metallization film systems.

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	Incident Beam Dia	Size(mm)	X/Y Type	Wavelength	Coating
	Screen Reset 30 20 18 16 15 14 12 10 8	Screen Reset 64433.5 54353.5 47313 3725.53 40262.5 27232.5 37.522.52.5 27202.5 33.5222.5 28172.5 3121.53 24163 26172 2116.82 23.2162 18.3132 2112.21.5 15.7111.5	Screen Reset Y X	Screen Reset 1064nm	Screen Reset Dielectric
More+ Less	30	64433.5	Y	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-30-Y Number：SI-SM-1064-30-Y Incident Beam Dia：30 Size(mm)：64433.5 X/Y Type：Y Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	30	54353.5	X	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-30-X Number：SI-SM-1064-30-X Incident Beam Dia：30 Size(mm)：54353.5 X/Y Type：X Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	20	47313	Y	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-20-Y Number：SI-SM-1064-20-Y Incident Beam Dia：20 Size(mm)：47313 X/Y Type：Y Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	20	3725.53	X	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-20-X Number：SI-SM-1064-20-X Incident Beam Dia：20 Size(mm)：3725.53 X/Y Type：X Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	18	40262.5	Y	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-18-Y Number：SI-SM-1064-18-Y Incident Beam Dia：18 Size(mm)：40262.5 X/Y Type：Y Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	18	27232.5	X	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-18-X Number：SI-SM-1064-18-X Incident Beam Dia：18 Size(mm)：27232.5 X/Y Type：X Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	16	37.522.52.5	Y	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-16-Y Number：SI-SM-1064-16-Y Incident Beam Dia：16 Size(mm)：37.522.52.5 X/Y Type：Y Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	16	27202.5	X	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-16-X Number：SI-SM-1064-16-X Incident Beam Dia：16 Size(mm)：27202.5 X/Y Type：X Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	15	33.5222.5	Y	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-15-Y Number：SI-SM-1064-15-Y Incident Beam Dia：15 Size(mm)：33.5222.5 X/Y Type：Y Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	15	28172.5	X	1064nm	Dielectric
Silicon Scanning Mirrors：SI-SM-1064-15-X Number：SI-SM-1064-15-X Incident Beam Dia：15 Size(mm)：28172.5 X/Y Type：X Wavelength：1064nm Substrate Material：Silicon（Si） Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%

Material Data
Optical Propertie
Transmission Range	1.2-15μm
Refractive Index	3.41776%@10μm
Reflection Loss	46.1%@10μm
Structure	Single crystal,synthetic
Cleavage Planes	<111>
Physical Properties
Density [g/cm3]	2.33
Melting Point [℃]	1414
Thermal Conductivity [W/(m×K)]	163 @ 313K
Thermal Expansion [10-6/K]	2.6 @ 293K
Knoop Hardness [kg/mm2]	1100
Specific Heat Capacity [J/(kg×K)]	712.8
Dielectric Constant	13 @f= 9.37GHz
Young's Modulus (E) [GPa]	130.91
Shear Modulus(G) [GPa]	79.92
Bulk Modulus(K) [GPa]	101.97
Poisson Coefficient	0.266
Chemical Properties
Solubility / g/L	None
Molecular Weight / g/mol	28.09

Silicon Scanning Mirrors 1064nm

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