1064nm Quartz Scanning Mirrors

Quartz Scanning Mirrors 1064nm

Quartz scanning mirrors have advantages such as high transparency, high precision, and high stability. Used in fields such as laser marking and laser cutting, it can be used to manufacture high-precision and high-quality marking and cutting. The principle is to first incident the laser beam onto the X-axis mirror, reflect it, and then incident it onto the Y-axis mirror. After the secondary reflection of the Y-axis mirror, it can be projected onto the working plane, forming a scanning point. Then, the beam deflector composed of X and Y scanning heads is driven by a galvanometer motor to deflect the laser beam within the predetermined scanning range, so that the laser focal point with a certain power density leaves a permanent mark on the marking material, completing the scanning of the image. Quartz mirrors have high transparency, which can reduce the loss of light energy and improve the utilization rate of laser. Can be coated with reflective film, anti reflective film, filter film, spectroscopic film, polarizing film, and metallized film.

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	Incident Beam Dia	Size(mm)	X/Y Type	Wavelength	Coating
	Screen Reset 30 20 14 10	Screen Reset 68.5464 55334 47313 3725.53 33.5213 2616.53 23.2162 18.3132	Screen Reset Y X	Screen Reset 1064nm	Screen Reset Dielectric
More+ Less	30	68.5464	Y	1064nm	Dielectric
Fused Silica Scanning Mirrors：JGS1-SM-1064-30-Y Number：JGS1-SM-1064-30-Y Incident Beam Dia：30 Size(mm)：68.5464 X/Y Type：Y Wavelength：1064nm Substrate Material：Fused Silica Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	30	55334	X	1064nm	Dielectric
Fused Silica Scanning Mirrors：JGS1-SM-1064-30-X Number：JGS1-SM-1064-30-X Incident Beam Dia：30 Size(mm)：55334 X/Y Type：X Wavelength：1064nm Substrate Material：Fused Silica Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	20	47313	Y	1064nm	Dielectric
Fused Silica Scanning Mirrors：JGS1-SM-1064-20-Y Number：JGS1-SM-1064-20-Y Incident Beam Dia：20 Size(mm)：47313 X/Y Type：Y Wavelength：1064nm Substrate Material：Fused Silica Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	20	3725.53	X	1064nm	Dielectric
Fused Silica Scanning Mirrors：JGS1-SM-1064-20-X Number：JGS1-SM-1064-20-X Incident Beam Dia：20 Size(mm)：3725.53 X/Y Type：X Wavelength：1064nm Substrate Material：Fused Silica Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	14	33.5213	Y	1064nm	Dielectric
Fused Silica Scanning Mirrors：JGS1-SM-1064-14-Y Number：JGS1-SM-1064-14-Y Incident Beam Dia：14 Size(mm)：33.5213 X/Y Type：Y Wavelength：1064nm Substrate Material：Fused Silica Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	14	2616.53	X	1064nm	Dielectric
Fused Silica Scanning Mirrors：JGS1-SM-1064-14-X Number：JGS1-SM-1064-14-X Incident Beam Dia：14 Size(mm)：2616.53 X/Y Type：X Wavelength：1064nm Substrate Material：Fused Silica Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	10	23.2162	Y	1064nm	Dielectric
Fused Silica Scanning Mirrors：JGS1-SM-1064-10-Y Number：JGS1-SM-1064-10-Y Incident Beam Dia：10 Size(mm)：23.2162 X/Y Type：Y Wavelength：1064nm Substrate Material：Fused Silica Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%
More+ Less	10	18.3132	X	1064nm	Dielectric
Fused Silica Scanning Mirrors：JGS1-SM-1064-10-X Number：JGS1-SM-1064-10-X Incident Beam Dia：10 Size(mm)：18.3132 X/Y Type：X Wavelength：1064nm Substrate Material：Fused Silica Length Tolerance(mm)：+0.0/-0.1 Width Tolerance(mm)：+0.0/-0.1 Thk Tolerance(mm)：+0.0/-0.05 Surface Quality：60-40 Surface Accuracy：λ/2 Coating：Dielectric Clear Aperture：90%

Material Data
Optical Properties
Transmission Range	0.18-2.1μm
Refractive Index@0.5876μm	1.4585
Physical Properties
Density [g/cm3]	2.21
Melting Point [deg C]	1900
Thermal Conductivity [W/(m×deg C)]	1.35
Thermal Expansion [deg C-1 ]	4.0*10-6
Specific Heat Capacity [J/(Kg*deg C ]	0.728*10-3
Young's Modulus [GPa]	7.36
Shear Modulus [GPa]	3.14
Poisson Coefficient	0.17
Chemical Properties
Solubility	Insoluble

Quartz Scanning Mirrors 1064nm

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