Fused Silica Scanning Mirrors:JGS1-SM-1064-30-Y
Number:JGS1-SM-1064-30-Y
Quartz scanning mirrors have advantages such as high transparency, high precision, and high stability. Used in fields such as laser marking and laser cutting, it can be used to manufacture high-precision and high-quality marking and cutting. The principle is to first incident the laser beam onto the X-axis mirror, reflect it, and then incident it onto the Y-axis mirror. After the secondary reflection of the Y-axis mirror, it can be projected onto the working plane, forming a scanning point. Then, the beam deflector composed of X and Y scanning heads is driven by a galvanometer motor to deflect the laser beam within the predetermined scanning range, so that the laser focal point with a certain power density leaves a permanent mark on the marking material, completing the scanning of the image. Quartz mirrors have high transparency, which can reduce the loss of light energy and improve the utilization rate of laser. Can be coated with reflective film, anti reflective film, filter film, spectroscopic film, polarizing film, and metallized film.
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Optical products are special items and cannot be returned or exchanged unless there is a quality issue with the product itself
If you need customization or bulk production, please contact us online and we will offer you a discounted price.
Incident Beam Dia | Dim(mm) | X/Y Type | Wavelength | Coating | Compare | |
---|---|---|---|---|---|---|
Screen | Screen | Screen | Screen | Screen | ||
More+ Less | 30 | 68.5*46*4 | Y | 1064nm | Dielectric | |
Fused Silica Scanning Mirrors:JGS1-SM-1064-30-Y Number:JGS1-SM-1064-30-Y
Incident Beam Dia:30
Dim(mm):68.5*46*4
X/Y Type:Y
Wavelength:1064nm
Substrate Material:Fused Silica
Length Tolerance(mm):+0.0/-0.1
Width Tolerance(mm):+0.0/-0.1
Thk Tolerance(mm):+0.0/-0.05
Surface Quality:60-40
Surface Accuracy:λ/2
Coating:Dielectric
Clear Aperture:90%
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More+ Less | 30 | 55*33*4 | X | 1064nm | Dielectric | |
Fused Silica Scanning Mirrors:JGS1-SM-1064-30-X Number:JGS1-SM-1064-30-X
Incident Beam Dia:30
Dim(mm):55*33*4
X/Y Type:X
Wavelength:1064nm
Substrate Material:Fused Silica
Length Tolerance(mm):+0.0/-0.1
Width Tolerance(mm):+0.0/-0.1
Thk Tolerance(mm):+0.0/-0.05
Surface Quality:60-40
Surface Accuracy:λ/2
Coating:Dielectric
Clear Aperture:90%
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More+ Less | 20 | 47*31*3 | Y | 1064nm | Dielectric | |
Fused Silica Scanning Mirrors:JGS1-SM-1064-20-Y Number:JGS1-SM-1064-20-Y
Incident Beam Dia:20
Dim(mm):47*31*3
X/Y Type:Y
Wavelength:1064nm
Substrate Material:Fused Silica
Length Tolerance(mm):+0.0/-0.1
Width Tolerance(mm):+0.0/-0.1
Thk Tolerance(mm):+0.0/-0.05
Surface Quality:60-40
Surface Accuracy:λ/2
Coating:Dielectric
Clear Aperture:90%
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More+ Less | 20 | 37*25.5*3 | X | 1064nm | Dielectric | |
Fused Silica Scanning Mirrors:JGS1-SM-1064-20-X Number:JGS1-SM-1064-20-X
Incident Beam Dia:20
Dim(mm):37*25.5*3
X/Y Type:X
Wavelength:1064nm
Substrate Material:Fused Silica
Length Tolerance(mm):+0.0/-0.1
Width Tolerance(mm):+0.0/-0.1
Thk Tolerance(mm):+0.0/-0.05
Surface Quality:60-40
Surface Accuracy:λ/2
Coating:Dielectric
Clear Aperture:90%
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More+ Less | 14 | 33.5*21*3 | Y | 1064nm | Dielectric | |
Fused Silica Scanning Mirrors:JGS1-SM-1064-14-Y Number:JGS1-SM-1064-14-Y
Incident Beam Dia:14
Dim(mm):33.5*21*3
X/Y Type:Y
Wavelength:1064nm
Substrate Material:Fused Silica
Length Tolerance(mm):+0.0/-0.1
Width Tolerance(mm):+0.0/-0.1
Thk Tolerance(mm):+0.0/-0.05
Surface Quality:60-40
Surface Accuracy:λ/2
Coating:Dielectric
Clear Aperture:90%
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More+ Less | 14 | 26*16.5*3 | X | 1064nm | Dielectric | |
Fused Silica Scanning Mirrors:JGS1-SM-1064-14-X Number:JGS1-SM-1064-14-X
Incident Beam Dia:14
Dim(mm):26*16.5*3
X/Y Type:X
Wavelength:1064nm
Substrate Material:Fused Silica
Length Tolerance(mm):+0.0/-0.1
Width Tolerance(mm):+0.0/-0.1
Thk Tolerance(mm):+0.0/-0.05
Surface Quality:60-40
Surface Accuracy:λ/2
Coating:Dielectric
Clear Aperture:90%
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More+ Less | 10 | 23.2*16*2 | Y | 1064nm | Dielectric | |
Fused Silica Scanning Mirrors:JGS1-SM-1064-10-Y Number:JGS1-SM-1064-10-Y
Incident Beam Dia:10
Dim(mm):23.2*16*2
X/Y Type:Y
Wavelength:1064nm
Substrate Material:Fused Silica
Length Tolerance(mm):+0.0/-0.1
Width Tolerance(mm):+0.0/-0.1
Thk Tolerance(mm):+0.0/-0.05
Surface Quality:60-40
Surface Accuracy:λ/2
Coating:Dielectric
Clear Aperture:90%
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More+ Less | 10 | 18.3*13*2 | X | 1064nm | Dielectric | |
Fused Silica Scanning Mirrors:JGS1-SM-1064-10-X Number:JGS1-SM-1064-10-X
Incident Beam Dia:10
Dim(mm):18.3*13*2
X/Y Type:X
Wavelength:1064nm
Substrate Material:Fused Silica
Length Tolerance(mm):+0.0/-0.1
Width Tolerance(mm):+0.0/-0.1
Thk Tolerance(mm):+0.0/-0.05
Surface Quality:60-40
Surface Accuracy:λ/2
Coating:Dielectric
Clear Aperture:90%
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Material Data | |
Optical Properties | |
Transmission Range | 0.18-2.1μm |
Refractive Index@0.5876μm | 1.4585 |
Physical Properties | |
Density [g/cm3] | 2.21 |
Melting Point [deg C] | 1900 |
Thermal Conductivity [W/(m×deg C)] | 1.35 |
Thermal Expansion [deg C-1 ] | 4.0*10-6 |
Specific Heat Capacity [J/(Kg*deg C ] | 0.728*10-3 |
Young's Modulus [GPa] | 7.36 |
Shear Modulus [GPa] | 3.14 |
Poisson Coefficient | 0.17 |
Chemical Properties | |
Solubility | Insoluble |
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