Silicon Scanning Mirrors 532nm

Silicon scanning mirrors have the advantages of light weight, small size, good thermal stability, and high mechanical strength. Applied to lasers, telescopes, microscopes, scanners, etc. Accurate optical control and image processing can be achieved by controlling parameters such as the direction and intensity of reflected light. Galvanometer scanning is the process of first incident the laser beam generated by the laser emission device onto the X-axis galvanometer, then reflecting it onto the Y-axis galvanometer. After secondary reflection by the Y-axis galvanometer, it can be projected onto the working plane, forming a scanning point. Then, the beam deflector composed of X and Y scanning heads is driven by a galvanometer motor to deflect the laser beam within the predetermined scanning range, so that the laser focal point with a certain power density leaves a permanent mark on the marking material, completing the scanning of the image. Each beam deflector has a specially designed reflector lens (coated with different optical films to reflect laser of different wavelengths), and the different deflection methods of the two lenses can enable the laser to scan different patterns and print different models.

  • Price
  • Invoice
  • Quality
  • Deivery
  • Logistics
  • Receive
  • Returns
  • Customized

Please leave a message or inquire about the price online to ensure a satisfactory price for you.

All products are provided with invoices, with a tax point of 13.

The product undergoes multiple inspections before being stored, and the quality is guaranteed. Please use it with confidence.

Spot products, shipped within 48 hours. For non stock or customized products, please consult.

International order logistics include DHL, FedEx, TNT, and EMS

When receiving the product, please ensure the integrity of the product packaging box first. If there is serious damage to the appearance, please refuse and contact us, and we will handle it for you as soon as possible.

Optical products are special items and cannot be returned or exchanged unless there is a quality issue with the product itself

If you need customization or bulk production, please contact us online and we will offer you a discounted price.

Technical Parameter

Material Data

Transmittance

Application Field

Related Products

  Incident Beam Dia Size(mm) X/Y Type Wavelength Coating Compare
  Screen Screen Screen Screen Screen  
More+ Less 10 18.3*13*2 X 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-10-X

Number:SI-SM-532-10-X

Incident Beam Dia:10 Size(mm):18.3*13*2 X/Y Type:X Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 10 23.2*16*2 Y 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-10-Y

Number:SI-SM-532-10-Y

Incident Beam Dia:10 Size(mm):23.2*16*2 X/Y Type:Y Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 12 21*16.8*2 X 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-12-X

Number:SI-SM-532-12-X

Incident Beam Dia:12 Size(mm):21*16.8*2 X/Y Type:X Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 12 26*17*2 Y 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-12-Y

Number:SI-SM-532-12-Y

Incident Beam Dia:12 Size(mm):26*17*2 X/Y Type:Y Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 14 24*16*3 X 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-14-X

Number:SI-SM-532-14-X

Incident Beam Dia:14 Size(mm):24*16*3 X/Y Type:X Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 14 31*21.5*3 Y 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-14-Y

Number:SI-SM-532-14-Y

Incident Beam Dia:14 Size(mm):31*21.5*3 X/Y Type:Y Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 15 28*17*2.5 X 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-15-X

Number:SI-SM-532-15-X

Incident Beam Dia:15 Size(mm):28*17*2.5 X/Y Type:X Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 15 33.5*22*2.5 Y 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-15-Y

Number:SI-SM-532-15-Y

Incident Beam Dia:15 Size(mm):33.5*22*2.5 X/Y Type:Y Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 8.5 15*11*1.6 X 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-8.5-X

Number:SI-SM-532-8.5-X

Incident Beam Dia:8.5 Size(mm):15*11*1.6 X/Y Type:X Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 8.5 20*12.3*1.6 Y 532nm Dielectric

Silicon Scanning Mirrors:SI-SM-532-8.5-Y

Number:SI-SM-532-8.5-Y

Incident Beam Dia:8.5 Size(mm):20*12.3*1.6 X/Y Type:Y Wavelength:532nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
Material Data
Optical Propertie
Transmission Range1.2-15μm
Refractive Index3.41776%@10μm
Reflection Loss46.1%@10μm
StructureSingle crystal,synthetic
Cleavage Planes<111>
Physical Properties
Density [g/cm3]2.33
Melting Point [℃]1414
Thermal Conductivity [W/(m×K)]163 @ 313K
Thermal Expansion [10-6/K]2.6 @ 293K
Knoop Hardness [kg/mm2]1100
Specific Heat Capacity [J/(kg×K)]712.8
Dielectric Constant13 @f= 9.37GHz
Young's Modulus (E) [GPa]130.91
Shear Modulus(G) [GPa]79.92
Bulk Modulus(K) [GPa]101.97
Poisson Coefficient0.266
Chemical Properties
Solubility / g/LNone
Molecular Weight / g/mol28.09

Silicon Transmittance Curve-CZSilicon Transmittance Curve-FZ

Everyone is asking

I want to customize

Hot Products

0

Consult

WeChat

微信扫码咨询

Tel

+8617733572335

Email

Top