Silicon Scanning Mirrors 355nm

Silicon scanning mirrors have the advantages of light weight, small size, good thermal stability, and high mechanical strength. Applied to lasers, telescopes, microscopes, scanners, etc. Accurate optical control and image processing can be achieved by controlling parameters such as the direction and intensity of reflected light. Galvanometer scanning is the process of first incident the laser beam generated by the laser emission device onto the X-axis galvanometer, then reflecting it onto the Y-axis galvanometer. After secondary reflection by the Y-axis galvanometer, it can be projected onto the working plane, forming a scanning point. Then, the beam deflector composed of X and Y scanning heads is driven by a galvanometer motor to deflect the laser beam within the predetermined scanning range, so that the laser focal point with a certain power density leaves a permanent mark on the marking material, completing the scanning of the image. Each beam deflector has a specially designed reflector lens (coated with different optical films to reflect laser of different wavelengths), and the different deflection methods of the two lenses can enable the laser to scan different patterns and print different models.

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Technical Parameter

Material Data

Transmittance

Application Field

Related Products

  Incident Beam Dia Size(mm) X/Y Type Wavelength Coating Compare
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More+ Less 10 18.3*13*2 X 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-10-X

Number:SI-SM-355-10-X

Incident Beam Dia:10 Size(mm):18.3*13*2 X/Y Type:X Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 10 23.2*16*2 Y 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-10-Y

Number:SI-SM-355-10-Y

Incident Beam Dia:10 Size(mm):23.2*16*2 X/Y Type:Y Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 12 21*16.8*2 X 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-12-X

Number:SI-SM-355-12-X

Incident Beam Dia:12 Size(mm):21*16.8*2 X/Y Type:X Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 12 26*17*2 Y 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-12-Y

Number:SI-SM-355-12-Y

Incident Beam Dia:12 Size(mm):26*17*2 X/Y Type:Y Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 14 26*16.5*3 X 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-14-X

Number:SI-SM-355-14-X

Incident Beam Dia:14 Size(mm):26*16.5*3 X/Y Type:X Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 14 31*21.5*3 Y 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-14-Y

Number:SI-SM-355-14-Y

Incident Beam Dia:14 Size(mm):31*21.5*3 X/Y Type:Y Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 15 28*17*2.5 X 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-15-X

Number:SI-SM-355-15-X

Incident Beam Dia:15 Size(mm):28*17*2.5 X/Y Type:X Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 15 33.5*22*2.5 Y 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-15-Y

Number:SI-SM-355-15-Y

Incident Beam Dia:15 Size(mm):33.5*22*2.5 X/Y Type:Y Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 20 37*25.5*3 X 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-20-X

Number:SI-SM-355-20-X

Incident Beam Dia:20 Size(mm):37*25.5*3 X/Y Type:X Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
More+ Less 20 47*31*3 Y 355nm Dielectric

Silicon Scanning Mirrors:SI-SM-355-20-Y

Number:SI-SM-355-20-Y

Incident Beam Dia:20 Size(mm):47*31*3 X/Y Type:Y Wavelength:355nm Substrate Material:Silicon(Si) Length Tolerance(mm):+0.0/-0.1 Width Tolerance(mm):+0.0/-0.1 Thk Tolerance(mm):+0.0/-0.05 Surface Quality:60-40 Surface Accuracy:λ/2 Coating:Dielectric Clear Aperture:90%
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Material Data
Optical Propertie
Transmission Range1.2-15μm
Refractive Index3.41776%@10μm
Reflection Loss46.1%@10μm
StructureSingle crystal,synthetic
Cleavage Planes<111>
Physical Properties
Density [g/cm3]2.33
Melting Point [℃]1414
Thermal Conductivity [W/(m×K)]163 @ 313K
Thermal Expansion [10-6/K]2.6 @ 293K
Knoop Hardness [kg/mm2]1100
Specific Heat Capacity [J/(kg×K)]712.8
Dielectric Constant13 @f= 9.37GHz
Young's Modulus (E) [GPa]130.91
Shear Modulus(G) [GPa]79.92
Bulk Modulus(K) [GPa]101.97
Poisson Coefficient0.266
Chemical Properties
Solubility / g/LNone
Molecular Weight / g/mol28.09

Silicon Transmittance Curve-CZSilicon Transmittance Curve-FZ

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